Materials characterisation & surface analysis services. Specialising in ion beam analysis including SIMS, ule SIMS, Auger, XPS, RBS, TEM and surface contamination (TOF SIMS, VPD-TXRF, VPD-ICPMS). Consultancy in various aspects of thin films and nano layers, semiconductor, photovoltaic materials, optical coatings and as an expert witness in cases involving patent infringement, product claim and reverse engineering.
Aystorm Scientific Ltd.
Aystorm Scientific Ltd.
2024-08-01
Materials characterisation & surface analysis services. Specialising in ion beam analysis including SIMS, ule SIMS, Auger, XPS, RBS, TEM and surface contamination (TOF SIMS, VPD-TXRF, VPD-ICPMS). Consultancy in various aspects of thin films and nano layers, semiconductor, photovoltaic materials, optical coatings and as an expert witness in cases involving patent infringement, product claim and reverse engineering.