Semiconsoft

2024-07-04

Science, Physics, Optics, Software - Semiconsoft. Thin Film Optical Metrology Software (Ellipsometry, Reflectance, Transmittance) for R&D and production.

Thin Film Optical Metrology Software (Ellipsometry, Reflectance, Transmittance) for R&D and production. The main product is TFCompanion, a software application for thin film analysis and metrology. Includes analytical tools for interpretation of measurement data. Available for all operating systems with JVM support (Windows, Apple, Unix).

Semiconsoft