Scientific Computing International - Raising Thin Film Metrology to a New Level. SCI offers metrology systems for thin-film material characterization, with models that range from table-top systems suitable for R&D to fully automated, standalone production tools, and software products for thin-film analysis and design
Scientific Computing International SCISoftware for optical thin film design, characterization and metrology systems. Current products include: Film Wizard, Film Spectrum and Film Ellipse.
2024-07-03
Science, Physics, Optics, Software - Scientific Computing International SCI. Software for optical thin film design, characterization and metrology systems.