Spectroscopic ellipsometers for thin film and bulk materials chacterization. Measures thin film thickness and material optical constants. In-situ and ex-situ, spectral ranges from Vacuum UV to Far IR.
J. A. Woollam Co., Inc.
jawoollam.com - Spectroscopic Ellipsometers
2024-06-30
Science, Instruments and Supplies, Laboratory Equipment, Spectroscopy - J. A. Woollam Co., Inc.. Spectroscopic ellipsometers for thin film and bulk materials chacterization.